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1

SPIE Proceedings [SPIE Visual Communications and Image Processing 2005 - Beijing, China (Tuesday 12 July 2005)] Visual Communications and Image Processing 2005 - Gradient-based image segmentation for face recognition robust to directional illumination

Kryszczuk, Krzysztof, Drygajlo, Andrzej

Year:

2005

Language:

english

File:

PDF, 332 KB

english, 2005

2

[IEEE 2017 IEEE International Conference on Big Data (Big Data) - Boston, MA (2017.12.11-2017.12.14)] 2017 IEEE International Conference on Big Data (Big Data) - A data-driven approach to predict NOx-emissions of gas turbines

Cuccu, Giuseppe, Danafar, Somayeh, Cudre-Mauroux, Philippe, Gassner, Martin, Bernero, Stefano, Kryszczuk, Krzysztof

Year:

2017

Language:

english

File:

PDF, 1.07 MB

english, 2017

3

Credence estimation and error prediction in biometric identity verification

Krzysztof Kryszczuk, Andrzej Drygajlo

Journal:

Signal Processing

Year:

2008

Language:

english

File:

PDF, 275 KB

english, 2008

4

Length-scale dependent transport properties of colloidal and protein solutions for prediction of crystal nucleation rates

Kalwarczyk, Tomasz, Sozanski, Krzysztof, Jakiela, Slawomir, Wisniewska, Agnieszka, Kalwarczyk, Ewelina, Kryszczuk, Katarzyna, Hou, Sen, Holyst, Robert

Journal:

Year:

2014

Language:

english

File:

PDF, 873 KB

english, 2014

5

[IEEE 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems (BTAS) - Washington, DC, USA (2009.09.28-2009.09.30)] 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems - Impact of combining quality measures on biometric sample matching

Kryszczuk, Krzysztof, Richiardi, Jonas, Drygajlo, Andrzej

Year:

2009

Language:

english

File:

PDF, 850 KB

english, 2009

6

[IEEE 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops - Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection

Kryszczuk, Krzysztof, Poh, Norman

Year:

2010

Language:

english

File:

PDF, 464 KB

english, 2010

7

[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Direct Printability Prediction in VLSI Using Features from Orthogonal Transforms

Kryszczuk, Krzysztof, Hurley, Paul, Sayah, Robert

Year:

2010

Language:

english

File:

PDF, 538 KB

english, 2010

8

[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Impact of feature correlations on separation between bivariate normal distributions

Kryszczuk, Krzysztof, Drygajlo, Andrzej

Year:

2008

Language:

english

File:

PDF, 203 KB

english, 2008

9

Reliability-Based Decision Fusion in Multimodal Biometric Verification Systems

Kryszczuk, Krzysztof, Richiardi, Jonas, Prodanov, Plamen, Drygajlo, Andrzej

Journal:

EURASIP Journal on Advances in Signal Processing

Year:

2007

Language:

english

File:

PDF, 759 KB

english, 2007

10

Detection of Slow Light Level Reduction

Kryszczuk, Krzysztof M., Boyce, Peter R.

Journal:

Journal of the Illuminating Engineering Society

Year:

2002

Language:

english

File:

PDF, 922 KB

english, 2002

11

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Design for Manufacturability through Design-Process Integration VI - Replacing design rules in the VLSI design cycle

Hurley, Paul, Kryszczuk, Krzysztof, Mason, Mark E.

Year:

2012

Language:

english

File:

PDF, 539 KB

english, 2012